X-Ray Diffraction (XRD)
Panalytical Empyrean 3, Malvern, Netherlands.
Measures all sample types from powders, thin films, solid objects, semi-conductors, and nanomaterials.
A search in the International Centre for Diffraction Data (ICDD) database of X-ray diffraction patterns enables the phase identification of a large variety of crystalline samples.
XRD is a powerful nondestructive technique for characterizing a wide range of crystalline materials.
Every crystalline material produce its own XRD pattern, because it is dependent on the internal structure, which is characteristic of that substance (FINGE RPRINT).
( XRD is able to determine )
* If the materials are Crystalline or Amorphous?
* Which phases are present?
* Purity of the materials.
* Thin film measurements.
* Crystallite size.
* Particle size.
( Phase identification )
A search in the International Centre for Diffraction Data (ICDD) database of X-ray diffraction patterns enables the phase identification of a large variety of crystalline samples.